XRF uses an x-ray source to excite a sample and measure the secondary x-rays emitted to determine and measure the elements present. It can give elemental concentrations in solids, powders, films, and liquids.
Below are the general sample requirements, if your sample doesn’t meet these requirements, please contact us.
There are three general types of measurement and analysis of samples. Accuracy of results and analysis time increases as you go down the list.


Example of Mapping: Silicon in a sample of granite at 500 μm resolution.

| Sample Material | Measurement Type | NIU | External Academic | Commercial |
|---|---|---|---|---|
|
Powder, Liquid, Film, Solid |
Bulk |
$40** |
$50** |
$80** |
|
Solid |
Points / Mapping |
Contact Us |
Contact Us |
Contact Us |
|
Technician Time |
N/A | N/A |
$300 |
|
*Academics that wish to be trained and run their own samples may be charged a reduced rate.
**If using a reference material or calibration curve for these samples, some technician time will be involved to design, test and implement the appropriate procedure. The time needed to conduct that design, testing and implementation procedure will depend on your samples and elements of interest. Samples with more than 10 elements to be measured will be charged at different rates. Contact us with sample information for an estimate.
Contact Josh Schwartz at joshua.schwartz@niu.edu if you have any questions.
Joshua Schwartz
Laboratory Manager
joshua.schwartz@niu.edu
815-753-7930