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Powder X-Ray Diffractometer

The Rigaku Miniflex X-Ray Diffractometer is a desk top powder diffractometer capable of measuring powder diffraction patterns from -3 to 150 degrees in two-theta. It can be used for phase identification, qualitative and quantitative analysis and quality control of raw materials and products. The types of samples can be multi-phase microcrystals of powdered materials, metal and ceramic plates, etc. It is equipped with a 6-sample holder for maximum automation of sample measurements. The X-ray of the Cu Kα radiation filtered by a Ni filter has a wavelength of 1.54178 Å.

 

Powder X-ray diffraction pattern of a photocatalyst sample:

 

 

structure determination

 

 

For access to the instrument and user training, please contact Professor Chong Zheng.