Powder X‐Ray Diffractometer

The Rigaku Miniflex X‐Ray Diffractometer is a desk top powder diffractometer capable of measuring powder diffraction patterns from −3 to 150 degrees in two‐theta. It can be used for phase identification, qualitative and quantitative analysis and quality control of raw materials and products. The types of samples can be multi‐phase microcrystals of powdered materials, metal and ceramic plates, etc. It is equipped with a 6‐sample holder for maximum automation of sample measurements. The X‐ray of the Cu Kα radiation filtered by a Ni filter has a wavelength of 1.54178 Å.

Powder X‐ray diffraction pattern of a photocatalyst sample:

structure determination

For access to the instrument and user training, please contact Professor Chong Zheng.