Powder X-Ray Diffractometer

The Rigaku Miniflex X-Ray Diffractometer is a desk top powder diffractometer capable of measuring powder diffraction patterns from -3 to 150 degrees in two-theta. It can be used for phase identification, qualitative and quantitative analysis and quality control of raw materials and products. The types of samples can be multi-phase microcrystals of powdered materials, metal and ceramic plates, etc. It is equipped with a 6-sample holder for maximum automation of sample measurements. The X-ray of the Cu Kα radiation filtered by a Ni filter has a wavelength of 1.54178 Å.


Powder X-ray diffraction pattern of a photocatalyst sample:



structure determination



For access to the instrument and user training, please contact Professor Chong Zheng.